eh25 series ? rohs compliant (pb-free) ? ceramic smd package ? 5.0v supply voltage ? hcmos/ttl output ? stability to 20ppm ? available on tape and reel oscillator eh25 manufacturer category series package voltage class rev . date ecliptek corp. oscillator eh25 ceramic 5.0v os48 0 7 /0 8 800-ecliptek www.ecliptek.com for latest revision specifications subject to change without notice. electrical specifications inclusive of all conditions: calibration tolerance at 25c, frequency stability over the operating temperature range, supply voltage change, output load change, first year aging at 25c, shock, and vibration w/ttl load w/hcmos load w/ttl load w/hcmos load at 1.4v dc w/ttl load; at 50% of waveform w/hcmos load (70.000mhz) at 50% of waveform w/ ttl load or w/hcmos load (>70.000mhz) at 50% of waveform w/ttl load or w/hcmos load 0.8v dc to 2.0v dc w/ttl load or 20% to 80% of waveform w/hcmos load ( 70.000mhz) 0.8v dc to 2.0v dc w/ttl load or 20% to 80% of waveform w/hcmos load (>70.000mhz) v ih :no connection v ih :2.2v dc v il :0.8v dc 70.000mhz >70.000mhz 1.000mhz to 155.520mhz 0c to 70c or -40c to 85c -55c to 125c 5.0v dc 10% 50ma maximum (unloaded) 100ppm, 50ppm, 25ppm, or 20ppm maximum 2.4v dc minimum i oh =-16ma v dd -0.4v dc minimum i oh =-16ma 0.4v dc maximum i ol =+16ma 0.5v dc maximum i ol =+16ma 50 10(%) (standard) 50 10(%) (standard) 50 5(%) (optional) 6 nseconds maximum 4 nseconds maximum enables output enables output disables output: high impedance 5ppm / year maximum 10 mseconds maximum 10ttl load or 50pf hcmos load maximum 5ttl load or 15pf hcmos load maximum 250psec maximum, 100psec typical 50psec maximum, 30psec typical frequency range operating temperature range storage temperature range supply voltage (v dd ) input current frequency tolerance / stability output voltage logic high (v oh ) output voltage logic low (v ol ) duty cycle (v dd =5.0v dc ) rise time / fall time tri-state input voltage aging (at 25c) start up time load drive capability period jitter: absolute period jitter: one sigma h 1.6 l 7.0 w 5.0
manufacturer category series package voltage class rev . date ecliptek corp. oscillator eh25 ceramic 5.0v os48 07/08 eh25 00 et t ts - 24.000m tr frequency tolerance / stability 00=100ppm maximum (standard), 45=50ppm maximum, 25=25ppm maximum, 20=20ppm maximum operating temp. range blank =0oc to 70oc, et=-40c to 85c duty cycle blank=50 10(%) (standard), t=50 5(%) part numbering guide mechanical dimensions all dimensions in millimeters tape and reel dimensions all dimensions in millimeters marking specifications environmental/mechanical specifications suggested solder pad layout all dimensions in millimeters *compliant to eia 481a tolerances = 0.1 800-ecliptek www.ecliptek.com for latest revision specifications subject to change without notice. 1.60 0.20 5.00 0.15 7.00 0.15 marking orientation 3.68 0.15 1.4 0.1 1.4 0.2 2.20 0.15 5.08 0.15 1 2 3 4 pin 1: tri-state pin 2: case ground pin 3: output pin 4: supply voltage available options blank=bulk (standard) tr=tape and reel frequency output control function ts=tri-state m n o p q 1.5 min 50 min 20.2 min 13.2 40 min r s t u v qty/reel 2.5 min 10 min 22.4 max 360 max 16.4+2-0 1,000 reel a b c d e f 16+.3-.1 7.5.1 6.75.1 4 .1 2.1 f g h j k l 8.1 b0* 1.5 +.1-0 a0* .3 .05 k0* reel line 1: ecliptek line 2: xx.xxx m frequency in mhz (5 digits maximum + decimal) line 3: p xx y zz week of year last digit of year ecliptek manufacturing identifier configuration designator characteristic specification esd susceptibility mil-std-883, method 3015, class 1, hbm: 1500v fine leak test mil-std-883, method 1014, condition a flammability ul94-v0 gross leak test mil-std-883, method 1014, condition c mechanical shock mil-std-883, method 2002, condition b moisture resistance mil-std-883, method 1004 moisture sensitivity j-std-020, msl 1 resistance to soldering heat mil-std-202, method 210, condition k resistance to solvents mil-std-202, method 215 solderability mil-std-883, method 2003 temperature cycling mil-std-883, method 1010, condition b vibration mil-std-883, method 2007, condition a
|
